Welcome » IEEE VAST08
IEEE Symposium on Visual Analytics Science and Technology (IEEE VAST), founded in 2006, is the first international symposium dedicated to advances in Visual Analytics Science and Technology. The scope of the symposium, co-located with the annual IEEE Visualization Conference (IEEE Vis) and the IEEE Information Visualization Conference (IEEE InfoVis), includes both fundamental research contributions within visual analytics as well as applications of visual analytics, including applications in science, security and investigative analysis, engineering, medicine, health, media, business, and social interaction. We invite you to participate in IEEE VAST 2008 by joining us in Columbus, Ohio.
For questions, please email firstname.lastname@example.org.» VAST Symposium Cochairs
Thomas Ertl, University of Stuttgart
David Ebert, Purdue University
IEEE VAST 2008 is part of
VisWeek 2008, which also includes:
|IEEE InfoVis 2008||IEEE Information Visualization Conference|
|IEEE Visualization 2008||IEEE Visualization Conference|
» Important Dates
Abstracts due (mandatory): Friday, March 21, 2008, 5:00pm PDT
Full papers due: Monday, March 31, 2008, 5:00pm PDT
Camera-ready Papers due: Tuesday, July 1, 2008, 5:00pm PDT
For other deadlines and to submit your work, please click here.