Welcome » IEEE VAST08

IEEE Symposium on Visual Analytics Science and Technology (IEEE VAST), founded in 2006, is the first international symposium dedicated to advances in Visual Analytics Science and Technology. The scope of the symposium, co-located with the annual IEEE Visualization Conference (IEEE Vis) and the IEEE Information Visualization Conference (IEEE InfoVis), includes both fundamental research contributions within visual analytics as well as applications of visual analytics, including applications in science, security and investigative analysis, engineering, medicine, health, media, business, and social interaction. We invite you to participate in IEEE VAST 2008 by joining us in Columbus, Ohio.

For questions, please email vast@vis.computer.org.

» VAST Symposium Cochairs

Thomas Ertl, University of Stuttgart
David Ebert, Purdue University

IEEE VAST 2008 is part of VisWeek 2008, which also includes:

IEEE InfoVis 2008     IEEE Information Visualization Conference
IEEE Visualization 2008     IEEE Visualization Conference

» Important Dates

Abstracts due (mandatory): Friday, March 21, 2008, 5:00pm PDT
Full papers due: Monday, March 31, 2008, 5:00pm PDT
Camera-ready Papers due: Tuesday, July 1, 2008, 5:00pm PDT

For other deadlines and to submit your work, please click here.

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Sponsored by the IEEE Computer Society
Visualization and Graphics Technical Committee.
© 2008 IEEE