The IEEE VAST Challenge continues in the footsteps of the VAST 2006 and 2007 contests and the 2008 Challenge with the purpose of pushing the forefront of visual analytics tools using benchmark data sets and establishing a forum to advance visual analytics evaluation methods. We also hope it will speed the transfer of VA technology from research labs to commercial products, and increase the availability of evaluation techniques.

In order to provide more opportunities for increased participation we offer an overall Grand Challenge as well as several smaller Mini Challenges. Teams may enter one or more Mini Challenges independently of the entering the Grand Challenge. ALL teams submitting an entry to a IEEE VAST Challenge will be invited to discuss their work during a challenge workshop.

Entries will be judged on both the correctness of the analysis (based on the availability of ground truth) and the utility of the tools in conducting the analysis. Participants have several months to prepare their submissions.

For more information click here.

Georges Grinstein, University of Massachusetts, Lowell
Catherine Plaisant, University of Maryland
Jean Scholtz, Pacific Northwest National Laboratory
Mark Whiting, Pacific Northwest National Laboratory