Call for Participation » VAST Contest

The IEEE VAST Challenge continues in the footsteps of the VAST 2006 and 2007 contests and the 2008 Challenge with the purpose of pushing the forefront of visual analytics tools using benchmark data sets and establishing a forum to advance visual analytics evaluation methods. We also hope it will speed the transfer of VA technology from research labs to commercial products, and increase the availability of evaluation techniques.

In order to provide more opportunities for increased participation we offer an overall Grand Challenge as well as several smaller Mini Challenges. Teams may enter one or more Mini Challenges independently of the entering the Grand Challenge. ALL teams submitting an entry to a IEEE VAST Challenge will be invited to discuss their work during a challenge workshop.

Entries will be judged on both the correctness of the analysis (based on the availability of ground truth) and the utility of the tools in conducting the analysis. Participants have several months to prepare their submissions.

For more information click here.

Tentative Timeline

February     Sample data available
March     Data sets available - Mini challenge topics finalized
June 20     Submissions deadline (except for two-page summaries)
August 1     Results returned to participants
August 10     Camera ready copies of 2 summaries due
October 10     Participant workshop before IEEE VAST 2009 (TBD)
October 11-16     IEEE VisWeek and IEEE VAST Symposium in Atlantic City, NJ

VAST Challenge Chairs

Georges Grinstein, University of Massachusetts, Lowell
Catherine Plaisant, University of Maryland
Jean Scholtz, Pacific Northwest National Laboratory
Mark Whiting, Pacific Northwest National Laboratory

Supporters (become one)
I2 logo
NIARL logo
Kitware logo
NVAC logo
nVidia logo
HP logo
Microsoft Research logo
VisMaster logo
NLM logo
IBM Research logo
ATI logo
Doctoral Colloquium Sponsor
NSF logo
Breaks Sponsor
Cyviz logo
SecureDecisions logo
Tableau logo
AK Peters
Morgan and Claypool logo
Palgrave-Macmillan logo
Springer logo
SCI logo