The IEEE Conference on Visual Analytics Science and Technology (IEEE VAST), founded in 2006, is the first international conference dedicated to advances in Visual Analytics Science and Technology. Previously named the IEEE Symposium on Visual Analytics Science and Technology, in 2010 IEEE VAST will be an IEEE Conference for the first time. The scope of the conference, co-located with the annual IEEE Visualization Conference (IEEE Vis) and the IEEE Information Visualization Conference (IEEE InfoVis), includes both fundamental research contributions within visual analytics as well as applications of visual analytics, including applications in science, security and investigative analysis, engineering, medicine, health, media, business, and social interaction. We invite you to participate in IEEE VAST 2010 by submitting your original research, application, or evaluation paper by March 31, 2010.
For questions, please email firstname.lastname@example.org.
IEEE VAST Conference Chairs
Brian Fisher, Simon Fraser University
William Pike, Pacific Northwest National Laboratory (PNNL)
IEEE VAST 2010 is part of
VisWeek 2010, which also
|IEEE InfoVis 2010||IEEE Information Visualization Conference|
|IEEE Visualization 2010||IEEE Visualization Conference|