October 24 - 29, 2010 | Salt Lake City, Utah, USA

Call for Participation » VAST Contest

The IEEE VAST 2010 Challenge continues in the footsteps of the IEEE VAST 2009 Challenge with the purpose of pushing the forefront of visual analytics tools using benchmark data sets and establishing a forum to advance visual analytics evaluation methods. We also hope it will speed the transfer of VA technology from research labs to commercial products, and increase the availability of evaluation techniques.

In order to provide more opportunities for increased participation we offer an overall Grand Challenge as well as several smaller Mini Challenges. Teams may enter one or more Mini Challenges independently of the entering the Grand Challenge. ALL teams submitting an entry to a IEEE VAST Challenge will be invited to discuss their work during the VAST Challenge Participant Workshop, before the conference. Entries will be judged on both the correctness of the analysis (based on the availability of ground truth) and the utility of the tools in conducting the analysis. Participants have several months to prepare their submissions. All submitted materials will be published in the Visual Analytics Benchmark Repository

For more information plese visit http://www.cs.umd.edu/hcil/VASTchallenge2010/.


Early March     Sample sets available - Mini challenge topics finalized
End of March     Data sets and tasks available
June 29     Submission deadline
August 10     Results returned to participants
August 25     Camera ready copies of 2 page summaries due
(TBD)     Participant workshop before IEEE VAST 2010
October 24-29     IEEE VisWeek and IEEE VAST Conference in Salt Lake City, UT

VAST Challenge Chairs

Georges Grinstein, University of Massachusetts, Lowell
Catherine Plaisant, University of Maryland
Jean Scholtz, Pacific Northwest National Laboratory
Mark Whiting, Pacific Northwest National Laboratory

Important Dates

VisWeek 2010
Sunday, October 24 - Friday, October 29, 2010

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